Dejan Stojaković, Franjo Pernuš:
Blister inspection by principal component analysis. 9. mednarodna elektrotehniška in računalniška konferenca - 9th International Electrotechnical and Computer Science Conference - ERK 2000, Sep 21-23, Portorož, Slovenia (B. Zajc, Ed.), 249-252, 2000 [
https://erk.fe.uni-lj.si/ ] [
COBISS-ID:1990740 ]