Matic Ivančič

Matic Ivančič, Ph.D.

Former Member

Education

2018
PhD in Electrical Enginnering (University of Ljubljana, Faculty of Electrical Enginnering, Slovenia)
2010
BSc in Physics (University of Ljubljana, Faculty of Mathematics and Physics, Slovenia)

Position

2014 -- 2018
Junior researcher at the Laboratory of Imaging Technologies (University of Ljubljana, Faculty of Electrical Enginnering, Slovenia)

Last Publications

2019
Matic Ivančič, Peter Naglič, Miran Bürmen: Določanje optičnih lastnosti sipajočih medijev s hiperspektralnim slikanjem. Elektrotehniški vestnik - Electrotechnical Review, 86(4):175-184, 2019 [https://ev.fe.uni-lj.si/ ] [COBISS-ID:12951636 ]
2018
Matic Ivančič, Peter Naglič, Franjo Pernuš, Boštjan Likar, Miran Bürmen: Efficient estimation of subdiffusive optical parameters in real time from spatially resolved reflectance by artificial neural networks. Optics Letters, 43(12):2901-2904, 2018 [doi:10.1364/OL.43.002901 ] [COBISS-ID:12098132 ]
2017
Matic Ivančič, Peter Naglič, Franjo Pernuš, Boštjan Likar, Miran Bürmen: Virtually increased acceptance angle for efficient estimation of spatially resolved reflectance in the subdiffusive regime: a Monte Carlo study. Biomedical Optics Express, 8(11):4872-4886, 2017 [doi:10.1364/BOE.8.004872 ] [COBISS-ID:11890004 ]
2018
Peter Naglič, Matic Ivančič, Franjo Pernuš, Boštjan Likar, Miran Bürmen: Portable measurement system for real-time acquisition and analysis of in-vivo spatially resolved reflectance in the subdiffusive regime. SPIE Photonics West 2018: BiOS - Design and Quality for Biomedical Technologies XI, Jan 27 - Feb 1, San Francisco, CA, USA (R. Raghavachari, R. Liang, Eds.), 10486:1048618, 2018 [doi:10.1117/12.2290460 ] [COBISS-ID:12020052 ]
2018
Peter Naglič, Matic Ivančič, Franjo Pernuš, Boštjan Likar, Miran Bürmen: Regression models for real-time estimation of optical and structural sample properties from subdiffusive spatially resolved reflectance. SPIE Photonics West 2018: BiOS - Optical Interactions with Tissue and Cells XXIX, Jan 27 - Feb 1, San Francisco, CA, USA (E. D. Jansen, H. T. Beier, Eds.), 10492:104920Q, 2018 [doi:10.1117/12.2291509 ] [COBISS-ID:12019284 ]