Matic Ivančič

dr. Matic Ivančič

Bivši član

Izobrazba

2018
Doktorat iz elektrotehniških znanosti (Univerza v Ljubljani, Fakulteta za elektrotehniko)
2010
Diploma iz fizike (Univerza v Ljubljani, Fakulteta za matematiko in fiziko)

Zaposlitve

2014 -- 2018
Mladi raziskovalec v Laboratoriju za slikovne tehnologije (Univerza v Ljubljani, Fakulteta za elektrotehniko)

Zadnje objave

2019
Matic Ivančič, Peter Naglič, Miran Bürmen: Določanje optičnih lastnosti sipajočih medijev s hiperspektralnim slikanjem. Elektrotehniški vestnik - Electrotechnical Review, 86(4):175-184, 2019 [https://ev.fe.uni-lj.si/ ] [COBISS-ID:12951636 ]
2018
Matic Ivančič, Peter Naglič, Franjo Pernuš, Boštjan Likar, Miran Bürmen: Efficient estimation of subdiffusive optical parameters in real time from spatially resolved reflectance by artificial neural networks. Optics Letters, 43(12):2901-2904, 2018 [doi:10.1364/OL.43.002901 ] [COBISS-ID:12098132 ]
2017
Matic Ivančič, Peter Naglič, Franjo Pernuš, Boštjan Likar, Miran Bürmen: Virtually increased acceptance angle for efficient estimation of spatially resolved reflectance in the subdiffusive regime: a Monte Carlo study. Biomedical Optics Express, 8(11):4872-4886, 2017 [doi:10.1364/BOE.8.004872 ] [COBISS-ID:11890004 ]
2018
Peter Naglič, Matic Ivančič, Franjo Pernuš, Boštjan Likar, Miran Bürmen: Portable measurement system for real-time acquisition and analysis of in-vivo spatially resolved reflectance in the subdiffusive regime. SPIE Photonics West 2018: BiOS - Design and Quality for Biomedical Technologies XI, Jan 27 - Feb 1, San Francisco, CA, USA (R. Raghavachari, R. Liang, Eds.), 10486:1048618, 2018 [doi:10.1117/12.2290460 ] [COBISS-ID:12020052 ]
2018
Peter Naglič, Matic Ivančič, Franjo Pernuš, Boštjan Likar, Miran Bürmen: Regression models for real-time estimation of optical and structural sample properties from subdiffusive spatially resolved reflectance. SPIE Photonics West 2018: BiOS - Optical Interactions with Tissue and Cells XXIX, Jan 27 - Feb 1, San Francisco, CA, USA (E. D. Jansen, H. T. Beier, Eds.), 10492:104920Q, 2018 [doi:10.1117/12.2291509 ] [COBISS-ID:12019284 ]